Test Generation of Crosstalk Delay Faults in VLSI Circuits eBook

$39.99

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits.

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About this eTextbook

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Publication details

Author: S. Jayanthy; M.C. Bhuvaneswari
Publisher: Springer
eText ISBN: 9789811324932, 981132493X
Print ISBN: 9789811324925, 9811324921

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About this eTextbook

Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Publication details

Author: S. Jayanthy; M.C. Bhuvaneswari
Publisher: Springer
eText ISBN: 9789811324932, 981132493X
Print ISBN: 9789811324925, 9811324921

What you receive

A licensed digital edition of this title, supplied as PDF or EPUB. The format is set by the publisher, so email us the ISBN before ordering and we will confirm which one it is.
Delivered to the email address on your order as a secure download link, usually within minutes and always within 24 hours of payment.
Download links do not expire and there is no cap on re-downloads. Readable on any computer, tablet or phone, online or offline.
This is a digital edition. Nothing is printed, packed or posted, and there is no delivery charge.